System and method for correcting design rule violations in a mask layout file

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20020144230A1
SERIAL NO

10159566

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Abstract

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A system and method for correcting design rule violations in a mask layout file are disclosed. The method includes comparing a feature dimension in a mask layout file with a design rule in a technology file. If the feature dimension is less than the design rule, a design rule violation is identified and automatically corrected in the mask layout file.

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Patent Owner(s)

Patent OwnerAddress
TOPPAN PHOTOMASKS INC131 OLD SETTLERS BOULEVARD ROUND ROCK TX 78664

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rittman, Dan Foster City, CA 20 337

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