Method and arrangement for calibrating an unbalance measuring apparatus
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United States of America Patent
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Issued Date -
Oct 17, 2002
app pub date -
Jan 22, 2002
filing date -
Feb 9, 2001
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method and an apparatus for calibrating an unbalance measuring apparatus, in which in a calibration run two calibration masses of the same or different sizes are simultaneously caused to rotate about a measuring axis in two axial calibration planes, wherein a calibration mass rotating about the measuring axis is simulated in another axial plane.
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