Wide field of view and high speed scanning microscopy
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United States of America Patent
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Dec 25, 2007
Grant Date -
Oct 24, 2002
app pub date -
Dec 27, 2001
filing date -
Mar 20, 1998
priority date (Note) -
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status (Latency Note)
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Abstract
A wide field of view scanning microscope includes a light source, a light detector, optics, a scanning assembly, a translation system, and a data collection control and processing unit. The scanning assembly is constructed to provide from the light source a light beam in a scanning motion to an examined surface. The optics includes an objective lens associated with the scanning assembly arranged to provide an optical path to the light detector. The translation system is constructed to produce a movement of the examined surface. The data collection control and processing unit is arranged to collect data during the scanning motion and process the collected data.
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