US Patent Application No: 2003/0010,124

Number of patents in Portfolio can not be more than 2000

Material analysis

ALSO PUBLISHED AS: 6786098

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Abstract

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Material analysis apparatus and method, particularly of use in detecting barely visible impact damage but also of use to detect other material characteristics. The apparatus includes a function generator (15) which provides a sinusoidal signal to an ultrasonic amplifier (14) as well as to a PC (16). The PC is connected to an infrared camera (17). The sinusoidal signal is fed into the amplifier and causes two probes (12, 13) attached to the sample of material to emit ultrasonic energy at the modulated frequency. Ultrasonic energy from the two probes then enters the sample (11) by means of a mechanical coupling and an image of the resulting thermal radiation is captured by the infrared camera and transferred to the PC for further processing and analysis.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
AIRBUS OPERATIONS LIMITEDBRISTOL777

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bates, Daniel Coventry, GB 10 146

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Patent Info (Count) # Cites Year
 
WAYNE STATE UNIVERSITY (2)
6,998,616 System and method for acoustic chaos and sonic infrared imaging 7 2003
* 7,064,332 Hand-held sound source for sonic infrared imaging of defects in materials 8 2004
 
SIEMENS ENERGY, INC. (1)
7,057,176 System and method for multiple mode flexible excitation in sonic infrared imaging 11 2005
 
UNITED TECHNOLOGIES CORPORATION (1)
7,064,330 Infrared defect detection via broad-band acoustics 1 2003
* Cited By Examiner