
US Patent Application No: 2003/0010,124
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Material analysis
Stats
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Jan 16, 2003
Publication date -
Jul 25, 2002
filing date -
10/181,263
serial no -
Granted
status
Importance
Abstract
Material analysis apparatus and method, particularly of use in detecting barely visible impact damage but also of use to detect other material characteristics. The apparatus includes a function generator (15) which provides a sinusoidal signal to an ultrasonic amplifier (14) as well as to a PC (16). The PC is connected to an infrared camera (17). The sinusoidal signal is fed into the amplifier and causes two probes (12, 13) attached to the sample of material to emit ultrasonic energy at the modulated frequency. Ultrasonic energy from the two probes then enters the sample (11) by means of a mechanical coupling and an image of the resulting thermal radiation is captured by the infrared camera and transferred to the PC for further processing and analysis.
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