Material analysis
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United States of America Patent
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Sep 7, 2004
Grant Date -
Jan 16, 2003
app pub date -
Jul 25, 2002
filing date -
Jan 20, 2000
priority date (Note) -
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Abstract
Material analysis apparatus and method, particularly of use in detecting barely visible impact damage but also of use to detect other material characteristics. The apparatus includes a function generator which provides a sinusoidal signal to an ultrasonic amplifier as well as to a PC. The PC is connected to an infrared camera. The sinusoidal signal is fed into the amplifier and causes two probes attached to the sample of material to emit ultrasonic energy at the modulated frequency. Ultrasonic energy from the two probes then enters the sample by means of mechanical coupling and an image of the resulting thermal radiation is captured by the infrared camera and transferred to the PC for further processing and analysis.
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