Device for measuring parameters of an electronic device
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United States of America Patent
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Apr 5, 2005
Grant Date -
Jan 23, 2003
app pub date -
Jul 24, 2002
filing date -
Aug 7, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
The inherent capacitance between the substrate and the drain of an SOI device is utilized as part of a circuit. The substrate is connected to a sensing pin brought external to the chip, and other electronic components are hooked up to form a circuit that includes and operates with the inherent capacitance between the substrate and the drain.
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