Computer controlled curve tracer for extracting small and large signal parameters of semiconductor devices
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United States of America Patent
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Issued Date -
Feb 6, 2003
app pub date -
Apr 9, 2002
filing date -
Apr 16, 2001
priority date (Note) -
Abandoned
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Abstract
A system and method for the analysis of electrical characterizations of semiconductor and electronic devices that utilizes a computing device to initiate a testing procedure of an electronic device by the delivery of a test voltage or current signal to the electronic device by way of the hardware interface. The electronic device's response to the voltage or current signals is measured by the hardware interface and the responsive signal is analyzed and the results displayed on a computing device.
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