Voltage testing and measurement
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United States of America Patent
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Oct 12, 2004
Grant Date -
Mar 27, 2003
app pub date -
Aug 14, 2002
filing date -
Jul 26, 1999
priority date (Note) -
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Abstract
A method of testing a device under test comprising providing a beam of light from a light source having a first wavelength. Imposing the beam of light on a test device over a spatial region within the test device substantially greater than the first wavelength, wherein the test device has a first state of refraction. Imposing the beam of light on the test device over a spatial region within the test device substantially greater than the first wavelength, wherein the test device has a second state of refraction. Obtaining data resulting from the interference of the first beam and the second beam within the device under test representative of the voltages within the region, wherein the first state of refraction is at a first voltage potential, and wherein the second state of refraction is at a second voltage potential different from the first voltage potential.
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