Methods for generating differential profiles by combining data obtained in separate measurements
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United States of America Patent
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Feb 10, 2004
Grant Date -
Apr 24, 2003
app pub date -
Jul 2, 2001
filing date -
Jul 2, 2001
priority date (Note) -
Expired
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Abstract
The invention provides methods for generating differential profiles having been subject to condition A vs. condition B (A vs. B) from data obtained in separately performed experimental measurements A vs. C and B vs. D. When C and D are the same, the invention provides methods for determination of systematic measurement errors or biases between different measurements carried out in different experimental reactions, i.e., cross-experiment errors or biases, using data measured for samples under the common condition and for removal or reduction of such cross-experiment errors. The invention further provides methods for generating differential profiles A vs. B from data obtained in single-channel measurements A and B.
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