Spectrum measuring instrument
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United States of America Patent
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Apr 12, 2005
Grant Date -
Jun 12, 2003
app pub date -
Dec 23, 2002
filing date -
Jun 21, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.
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