Test meter calibration
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United States of America Patent
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N/A
Issued Date -
Jun 19, 2003
app pub date -
Oct 4, 2002
filing date -
Dec 13, 2001
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
The invention provides a test meter (1) that may be calibrated using a calibration member (16). The calibration member (16) has at least one conductive region (38) of predetermined electrical resistance. The test meter (1) has at least two calibration electrodes (24), processor (34) and dispensing mechanism (22). The dispensing mechanism (22) can be used to dispense a calibration member (16) from the test meter (1). The conductive regions (38) of the calibration member make contact with the electrodes (24) as it is dispensed. The processor (34) receives a signal from the electrodes (24) as the calibration member (16) is dispensed. The processor (34) then processes said signal and generates a calibration signal to calibrate the test meter (1). The invention extends to a method of calibrating a test meter, a cartridge (18) for a test meter and a calibration member (16).
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