Method and apparatus for detecting faults on integrated circuits
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United States of America Patent
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Issued Date -
Aug 7, 2003
app pub date -
Feb 1, 2002
filing date -
Feb 1, 2002
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A scan-cell for use in a scan device of the type which is utilized to test integrated circuits comprises a first multiplexer, a switching device, and a second multiplexer. The first multiplexer provides a data signal on the output thereof when a control signal is in a first state and provides a test signal at the output thereof when the control signal is in a second state. The switching device is coupled to the output of the first multiplexer and captures the output. The second multiplexer has an input coupled to the output of the switching device and transmits the output when the control signal is in the first state. The second multiplexer transmits an inverted form of the output when the control signal is in the second state.
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