Apparatus for determining dynamic gaps between a proximity probe and a conductive target material
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United States of America Patent
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Nov 30, 2004
Grant Date -
Dec 4, 2003
app pub date -
May 27, 2003
filing date -
Oct 22, 1999
priority date (Note) -
Expired
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Abstract
A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
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