Multi-walled carbon nanotube scanning probe apparatus having a sharpened tip and method of sharpening for high resolution, high aspect ratio imaging
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United States of America Patent
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Issued Date -
Dec 25, 2003
app pub date -
May 16, 2003
filing date -
May 17, 2002
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method provides a sharpened Multi-Walled Carbon NanoTube Scanning Probe (MWCNT-SP) for a Atomic Force Microscopy (AFM). The MWCNT-SP is attached to a cantilever and help in the FMA. The tip of the MWCNT-SP is positioned in contact with a conducting substrate, and a voltage source is connected to the MWCNT-SP and to the substrate. The outer layers of the MWCNT-SP become hot, and the outermost carbon layers burns off, thereby creating a point on the MWCNT-SP.
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