Electrical isolation between pins sharing the same tester channel
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United States of America Patent
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N/A
Issued Date -
Dec 25, 2003
app pub date -
Jun 20, 2002
filing date -
Jun 20, 2002
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A new apparatus and method for simultaneously testing a plurality of circuit devices are achieved. The apparatus comprises, first, a tester having at least one output signal. A plurality of circuit devices is used. Each circuit device has at least one input signal. Finally, a plurality of auto-reset fuses is used. Each auto-reset fuse is coupled between the tester output signal and one of the input signals of the plurality of circuit devices. The auto-reset fuses automatically switch from low impedance during low current to high impedance during high current. The auto-reset fuses automatically switch from high impedance to low impedance after a waiting time.
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