High throughput absolute flaw imaging

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20040004475A1
SERIAL NO

10419702

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.

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Patent Owner(s)

Patent OwnerAddress
JENTEK SENSORS INC121 BARTLETT ST MARLBOROUGH MA 01752

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cargill, J Stephen Hobe Sound, FL 1 20
Goldfine, Neil J Newton, MA 108 1961
Grundy, David C Reading, MA 41 908
Schlicker, Darrell E Watertown, MA 61 1198
Shay, Ian C Cambridge, MA 22 490
Tsukernik, Vladimir West Roxbury, MA 18 1212
Washabaugh, Andrew P Chula Vista, CA 69 1418
Windoloski, Mark D Burlington, MA 15 248
Zilberstein, Vladimir A Chestnut Hill, MA 33 815

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