Compensation for test signal degradation due to DUT fault
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United States of America Patent
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Nov 2, 2004
Grant Date -
Jan 15, 2004
app pub date -
Jul 12, 2002
filing date -
Jul 12, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage.
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