Test system for device and method thereof
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United States of America Patent
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Apr 25, 2006
Grant Date -
Feb 5, 2004
app pub date -
Jul 31, 2002
filing date -
Jul 31, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
In one embodiment, a contactor (200) is provided. The contactor (200) comprises a device side (210), a test circuit board side (155), and a thickness (110). The device side (210) is in communication with at least three electrical contact points (140, 141, 142) of the device (170). The test circuit board side (155) includes a fourth electrical contact point (193) in electrical communication with the circuit board (150). The contactor (200) also includes a first electrical pathway (220) between the first electrical contact point (140) and the second electrical contact point (142). The first electrical pathway (220) bypasses the circuit board (150). The contactor (200) further includes a second electrical pathway (270) between the third electrical contact point (142) and the fourth electrical contact point (193).
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