Method and apparatus for performing multiport through-reflect-line calibration and measurement

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United States of America Patent

PATENT NO 6853198
APP PUB NO 20040095145A1
SERIAL NO

10294317

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Abstract

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A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration standard between each one of N direct pairs of the measurement ports and measuring forward and reverse reflection and transmission responses and calculating a load match error coefficient for each measurement port, and presenting only the through calibration standard between indirect pairs of measurement ports and calculating the forward and reverse transmission tracking for each indirect pairs of measurement ports.

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Patent Owner(s)

Patent OwnerAddress
KEYSIGHT TECHNOLOGIES INC1400 FOUNTAINGROVE PKWY SANTA ROSA CA 95403

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adamian, Vahe Lexington, MA 5 401
Boudiaf, Ali Malden, MA 4 129
Phillips, Peter Leominister, MA 51 1387

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