Apparatus and method for testing electronic systems
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United States of America Patent
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Mar 17, 2009
Grant Date -
Sep 9, 2004
app pub date -
May 29, 2003
filing date -
Mar 7, 2003
priority date (Note) -
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Abstract
The technology and economics of system testing have evolved to the point where a radical change in methodology is needed for effective functional testing of systems at clock rates of 1 GHz and higher. Rather than providing a test fixture to interface between the system under test and an external tester, it is preferable to provide critical testing functions within each electronic system in the form of one or more special-purpose test chips. An architecture is proposed that supports full-speed testing with improved noise margins, and also efficient methods for learning correct system behavior and generating the test vectors. The test program is preferably written using the same programming language as used for the system application.
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