Structures for testing circuits and methods for fabricating the structures
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Apr 16, 2003
filing date -
Mar 12, 2003
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a substrate having contactors on a first side and pads on a second side; (b) a card having pads on a first side; (c) an interconnector that electrically connects the pads on the second side of the substrate with the pads on the card, the interconnector comprising a connector-holder comprised of electrical connectors having first and second retractable ends that are extendable out of a first and second side of the connector-holder, respectively, wherein the first retractable ends contact pads on the substrate, and the second retractable ends contact pads on the card; and (d) a clamp that is adapted to fit over the substrate and the connector-holder, the clamp having an opening to provide access to the contactors, and which clamp is connected to the card.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully