Systems and methods for detecting manufacturing defects in microfluidic devices
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United States of America Patent
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Issued Date -
Sep 16, 2004
app pub date -
Mar 10, 2004
filing date -
Mar 14, 2003
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Microfluidic devices including one or more microstructures adapted to provide an indication of the extent and severity of collapse of channels and other microstructures within the device are provided. The channel collapse test structures do not communicate with operational structures of the device, but are positioned and adapted to provide an indication of the structural integrity of similarly dimensioned operational structures.
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