Microscope, especially laser scanning microscope

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United States of America Patent

SERIAL NO

10819438

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Abstract

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A microscope, especially a laser scanning microscope, with illumination over one wavelength and/or a plurality of wavelengths, wherein a controlling of the intensity of at least one wavelength is carried out by at least one rotatable interference filter which is arranged in the illumination beam path, wherein the at least one wavelength is at least partially reflected out of the illumination beam path and a plurality of filters for different wavelengths can be arranged one behind the other in the illumination beam path.

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Patent Owner(s)

Patent OwnerAddress
WOLLESCHENSKY RALFNot Provided

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Simon, Ulrich Rothestein, DE 57 965
Stock, Michael Apolda, DE 18 106
Wolleschensky, Ralf Schoeten, DE 182 1791

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