Method for on-line machine vision measurement, monitoring and control of organoleptic properties of products for on-line manufacturing processes

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United States of America Patent

PATENT NO 7660440
APP PUB NO 20040197012A1
SERIAL NO

10832676

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Abstract

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A method for extracting feature information from product images using multivariate image analysis (MIA) to develop predictive models for organoleptic and other feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. The method may also be integrated into a closed-loop feedback control system in automated systems.

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MCMASTER UNIVERSITYHAMILTON ON

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bourg,, Jr Wilfred Marcellien Melissa, US 25 232
Bresnahan, Steven Andrew Plano, US 4 69
Bruwer, Mark-John Hamilton, CA 6 107
MacGregor, John F Dundas, CA 3 56
Martin, Paul Allan Celina, US 3 75
Yu, Honglu Fort Erie, CA 2 37

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