Fast feature selection method and system for maximum entropy modeling

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United States of America Patent

PATENT NO 7324927
APP PUB NO 20050021317A1
SERIAL NO

10613366

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Abstract

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A method to select features for maximum entropy modeling in which the gains for all candidate features are determined during an initialization stage and gains for only top-ranked features are determined during each feature selection stage. The candidate features are ranked in an ordered list based on the determined gains, a top-ranked feature in the ordered list with a highest gain is selected, and the model is adjusted using the selected top-ranked feature.

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Patent Owner(s)

  • THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Weng, Fuliang Mountain View, CA 69 4925
Zhou, Yaqian Shanghai, CN 1 14

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