Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration
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United States of America Patent
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Jun 27, 2006
Grant Date -
Feb 10, 2005
app pub date -
Aug 5, 2003
filing date -
Aug 5, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and.GAMMA..GAMMA..times..times..times..times..times. ##EQU00001## wherein S.sub.21.sub.--.sub.thru.sub.--.sub.nm is equal to S.sub.12.sub.--.sub.thru.sub.--.sub.mn and an argument of both solutions for S.sub.21.sub.--.sub.thru.sub.--.sub.nm is fit to a straight line, the solution having a y-intercept closest to zero being a correct solution and a resulting argument of the correct solution being the electrical delay.
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