Real time closed-loop process control system for defect prevention

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United States of America Patent

APP PUB NO 20050033464A1
SERIAL NO

10899406

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Abstract

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A method is provided for executing a monitoring process during a manufacturing process to produce products. The method measures, in real time, performance variables of an upstream portion of a present manufacturing process, analyzes, with a processor, trends in the performance variables of the present manufacturing process together with data that models a portion of a subsequent manufacturing process, that occurs after the present manufacture process, to predict performance of the subsequent manufacturing process, sends trend analysis information to the present manufacturing process, and sends information to the subsequent manufacturing process.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS DEMATIC ELECTRONICS ASSEMBLY SYSTEMS INC2875 NORTHWOODS PARKWAY NORCROSS GA 30071

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nguyen, Tuan Minh Munich, DE 6 97

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