Transfer robot and inspection method for thin substrate
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United States of America Patent
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Aug 9, 2005
Grant Date -
Feb 17, 2005
app pub date -
Sep 1, 2004
filing date -
Dec 1, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
A transfer robot (5) for thin substrate capable of efficiently detecting the stored state of thin substrates and an inspection method for thin substrate capable of accurately detecting the stored state of thin substrates; the robot (5), comprising an inspection camera (1) for detecting the stored state of the thin substrates (3) in a storage cassette (2), wherein the plurality of thin substrates (3) stored in the storage cassette (2) are carried out from the storage cassette (2) by the robot.
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