Film forming material, film forming method, and film

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United States of America Patent

APP PUB NO 20050048799A1
SERIAL NO

10895827

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Abstract

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A technique is provided of creating high-purity amorphous gate oxides film through a CVD process. In the technique of creating Hf--Si oxide films through the chemical vapor deposition process, Si(OR).sub.4 and Hf(NR'R').sub.4 are used.

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Patent Owner(s)

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TRI CHEMICAL LABORATORIES INCYAMANASHI PREFECTURE YAMANASHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishikawa, Masato Yamanashi, JP 64 634
Kada, Takeshi Yamanashi, JP 16 76
Machida, Hideaki Yamanashi, JP 31 109
Ohshita, Yoshio Aichi, JP 9 48

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