Irradiation system having cybernetic parameter acquisition system
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United States of America Patent
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Issued Date -
Apr 14, 2005
app pub date -
Oct 10, 2003
filing date -
Oct 10, 2003
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Irradiation system including a cybernetic parameter acquisition system, for acquiring parameter data associated with an object to be irradiated. The system includes apparatus for measuring doses of electron beams that are absorbed by an object subjected to irradiation. The absorbed dose can be continuously measured during an irradiation process, and adjustment can be made to operating parameters of the irradiation system in accordance with the measured absorbed dose.
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