Sample element for use in material analysis
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United States of America Patent
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Issued Date -
May 19, 2005
app pub date -
Jun 25, 2004
filing date -
Apr 15, 2003
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A system and method are provided for determining a concentration of an analyte in a material sample. The method includes providing a sample element with a sample chamber at least partially defined by at least one window formed from a material having greater than about 1% wavelength-domain variation in absorbtivity of electromagnetic radiation incident thereon. The method further includes employing the sample element with an analyte detection system which determines the concentration of the analyte with clinically acceptable accuracy.
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