Method for monitoring a technical system
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United States of America Patent
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Issued Date -
Jun 2, 2005
app pub date -
Nov 24, 2004
filing date -
Nov 25, 2003
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention relates to method for the model-based monitoring of a technical system. In a model of the defect-free system which describes the relationship in the defect-free system between an influenced variable y and an input variable u, a measuring inaccuracy for the measuring of y is determined. In a tolerance simulation, at least one model parameter is varied within a prescribed tolerance. In this way it is calculated how large the variation of the influenced variable y that is brought about by the parameter variation is. During the monitoring, the variation over time of the input variable u is fed both to the technical system and to the model. With the aid of the model, a reference variation over time of the influenced variable y is calculated. A narrow tolerance band and a wide tolerance band are placed around the calculated reference variation. If the measured variation over time lies outside the wide tolerance band, the technical system is classified as defective. If it lies within the narrow tolerance band, the technical system is classified as defect-free.
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