Methods and apparatus to minimize debugging and testing time of applications
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United States of America Patent
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Issued Date -
Jun 2, 2005
app pub date -
Nov 14, 2003
filing date -
Nov 14, 2003
priority date (Note) -
Abandoned
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Abstract
Methods and apparatus to minimize debugging and testing time of applications are described herein. In an example method, an instrumented code of the application is generated. A plurality of tests is executed on the instrumented code of the application. One or more test profiles associated with the plurality of tests are generated. A list containing at least one of the plurality of tests based on the one or more test profiles is identified.
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