Image sensor applied with device isolation technique for reducing dark signals and fabrication method thereof

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United States of America Patent

APP PUB NO 20050127462A1
SERIAL NO

10882846

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Abstract

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The present invention relates to an image sensor applied with a device isolation technique for reducing dark signals and a fabrication method thereof. The image sensor includes: a logic unit; and a light collection unit in which a plurality of photodiodes is formed, wherein the photodiodes are isolated from each other by a field ion-implantation region formed under a surface of a substrate and an insulation layer formed on the surface of the substrate.

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Patent Owner(s)

Patent OwnerAddress
CROSSTEK CAPITAL LLC2711 CENTERVILLE ROAD SUITE 400 WILMINGTON DE 19808

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ko, Ho-Soon Ichon-shi, KR 3 7
Rim, Jae-Young Ichon-shi, KR 4 44

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