Probe card with coplanar daughter card
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United States of America Patent
Stats
-
Oct 3, 2006
Issued Date -
N/A
app pub date -
Feb 15, 2005
filing date -
Apr 10, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe card assembly includes a printed circuit board with tester contacts for making electrical connections to a semiconductor tester. The probe card assembly also includes a probe head assembly with probes for contacting a semiconductor device under test. One or more daughter cards is mounted to the printed circuit board such that they are substantially coplanar with the printed circuit board. The daughter cards may contain a circuit for processing test data, including test signals to be input into the semiconductor and/or response signals generated by the semiconductor device in response to the test signals.
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