System, method, and medium for monitoring performance of an advanced process control system

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United States of America Patent

PATENT NO 7356377
APP PUB NO 20050171626A1
SERIAL NO

10765921

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Abstract

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A method for monitoring performance of an advanced process control system for at least one process output includes calculating a variance of a prediction error for a processing performance and/or a probability for violating specification limits of the processing performance of the at least one process output. If the variance of the prediction error is calculated, the method also includes calculating a model health index. If the probability for violating specification limits is calculated, the method further includes calculating a process health index.

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Patent Owner(s)

  • APPLIED MATERIALS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schwarm, Alexander T Austin, TX 35 1040

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