System and method for identifying critical features in an ordered scale space within a multi-dimensional feature space

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United States of America Patent

APP PUB NO 20050171948A1
SERIAL NO

10317438

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Abstract

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A system and method for identifying critical features in an ordered scale space within a multi-dimensional feature space is described. Features are extracted from a plurality of data collections. Each data collection is characterized by a collection of features semantically-related by a grammar. Each feature is normalized and frequencies of occurrence and co-occurrences for the feature for each of the data collections is determined. The occurrence frequencies and the co-occurrence frequencies for each of the features are mapped into a set of patterns of occurrence frequencies and a set of patterns of co-occurrence frequencies. The pattern for each data collection is selected and distance (similarity) measures between each occurrence frequency in the selected pattern is calculated. The occurrence frequencies are projected onto a one-dimensional document signal in order of relative decreasing similarity using the similarity measures. Wavelet and scaling coefficients are derived from the one-dimensional document signal using multiresolution analysis.

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Patent Owner(s)

Patent OwnerAddress
NUIX NORTH AMERICA INC13755 SUNRISE VALLEY DR HERNDON VA 20171

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Knight, William C Bainbridge Island, WA 49 954

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