INFRARED DETECTION OF SOLAR CELL DEFECTS UNDER FORWARD BIAS
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United States of America Patent
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Issued Date -
Nov 17, 2005
app pub date -
May 12, 2004
filing date -
May 12, 2004
priority date (Note) -
Abandoned
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Abstract
Methods and apparatus are disclosed for detecting solar cell defects by applying a forward-biasing electric current through a silicon solar cell or a group of interconnected solar cells for a short duration and then analyzing the resulting thermal image of each cell with an infrared (IR) camera. The invention is particularly useful in assembling solar cell arrays or modules in which large numbers of cells are to be wired together. Automated module assemblers are disclosed in which the cells (or strings of cells) are tested for defects prior to final module assembly.
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