Material analysis including density and moisture content determinations

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United States of America Patent

PATENT NO 7219024
APP PUB NO 20050267700A1
SERIAL NO

11127391

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.

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Patent Owner(s)

  • TRANSTECH SYSTEMS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gamache, Ronald W East Greenbush, NY 27 891
Hosterman, Richard Buskirk, NY 1 52
Pluta, Sarah Clifton Park, NY 2 73

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