Intelligent probe chips/heads
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United States of America Patent
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N/A
Issued Date -
Dec 29, 2005
app pub date -
Jun 24, 2005
filing date -
Jun 24, 2004
priority date (Note) -
Abandoned
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Abstract
An intelligent probe chip or probe head can include design-for-test (DFT) circuitry that would otherwise be required in a device being tested and/or implement testing functions so that less-expensive automated test equipment (ATE) can test the device.
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