Integrated resistance cancellation in temperature measurement systems

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United States of America Patent

PATENT NO 7281846
APP PUB NO 20060039445A1
SERIAL NO

10924176

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A temperature measurement device may be implemented by coupling a PN-junction, which may be comprised in a diode, to an analog-to-digital converter (ADC) that comprises an integrator. Different currents may be successively applied to the diode, resulting in different V.sub.BE values across the diode. The .DELTA.V.sub.BE values thus obtained may be successively integrated. Appropriate values for the different currents may be determined based on a set of mathematical equations, each equation relating the V.sub.BE value to the temperature of the diode, the current applied to the diode and parasitic series resistance associated with the diode. When the current sources with the appropriate values are sequentially applied to the diode and the resulting diode voltage differences are integrated by the integrator comprised in the ADC, the error in the temperature measurement caused by series resistance is canceled in the ADC, and an accurate temperature reading of the diode is obtained from the output of the ADC.

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Patent Owner(s)

  • MICROCHIP TECHNOLOGY INCORPORATED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
McLeod, Scott C Oro Valley, AZ 34 582

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