Method for testing an electric circuit
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United States of America Patent
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-
Mar 13, 2007
Grant Date -
Mar 9, 2006
app pub date -
Aug 29, 2005
filing date -
Aug 27, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
In a method for testing an electric circuit, a first circuit is produced by a first process sequence. A first signal is applied to the first circuit and a signal indicating if the first circuit is defective is generated by comparing the first signal with the first circuit output signal. Then, a second circuit is produced by a second process sequence which includes incorporating at least one intentional defect structure. The first signal is applied to the second circuit and a signal is generated by comparing the first signal with the second circuit output in response to the first signal. A modified signal is applied to the second circuit, until a comparison of the modified signal and the respective response of the second circuit indicates a defective second circuit. Information about the modified signal resulting in the indication of a defective second circuit is stored.
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