Segmented field sensors
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United States of America Patent
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Issued Date -
Nov 10, 2005
app pub date -
Feb 11, 2005
filing date -
Feb 12, 2004
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Apparatus and methods are described for assessing material condition through magnetic field measurements that provide material property information at multiple depths into the material. The measurements are obtained from sense elements located at different distances from an excitation drive winding, with the area of each sense element adjusted so that the flux of magnetic field through each sense element is approximately the same when over a reference material. These sense element responses can be combined, for example by subtraction, to enhance sensitivity to hidden features, such as cracks beneath fastener heads, while reducing the influence from variable effects, such as fastener material type and placement. Measurement responses can also be converted into effective material properties, using a model that accounts for known properties of the sensor and test material, which are then correlated with the size of the surface breaking or hidden features.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- JENTEK SENSORS, INC.
International Classification(s)
Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Goldfine, Neil J | Newton, US | 108 | 1961 |
| Grundy, David C | Reading, US | 41 | 908 |
| Schlicker, Darrell E | Watertown, US | 61 | 1198 |
| Shay, Ian C | Waltham, US | 22 | 490 |
| Washabaugh, Andrew P | Chula Vista, US | 69 | 1418 |
| Windoloski, Mark D | Burlington, US | 15 | 248 |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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