Systems, methods and slurries for chemical mechanical polishing

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United States of America Patent

APP PUB NO 20060084271A1
SERIAL NO

10970547

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Process, slurries formulation and polishing mechanism are disclosed for the formation of silver (Ag) or Ag alloy film features on a substrate using CMP. The process and slurries can achieve Ag or Ag alloy film features with good planarization, low roughness, high reflectivity, and low defectivity.

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Patent Owner(s)

Patent OwnerAddress
ANJI MICROELECTRONICS (SHANGHAI) CO LTD201203 FLOOR 1-2 BLOCK E BUILDING 1 NO 889 BIBO ROAD ZHANGJIANG HIGH TECH PARK PUDONG NEW AREA SHANGHAI SHANGHAI CITY SHANGHAI CITY 201203

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yang, Andy Chunxiao Shanghai, CN 5 29
Yu, Chris Chang Shanghai, CN 26 578

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