Non-contact apparatus and method for measuring surface profile
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United States of America Patent
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Jun 3, 2008
Grant Date -
May 18, 2006
app pub date -
Dec 22, 2005
filing date -
Jun 27, 2001
priority date (Note) -
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status (Latency Note)
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Abstract
Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.
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