System and method for evaluating materials using ultra wideband signals
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
May 18, 2006
app pub date -
Nov 17, 2004
filing date -
Nov 17, 2004
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A system for evaluating properties of materials by probing the materials using ultra wideband signals wherein the probing may be by transmission or by reflection of radiated ultra wideband signals. Received signals may be evaluated by determining signal characteristics including reflection coefficient, transmission attenuation, multipath decay profile, and signal scattering coefficient. Received signals are evaluated using deconvolution and Fourier processing. Test chamber characteristics and boundary reflections may be removed to yield bulk material properties. The system may be calibrated by employing empirical signal measurements from materials with known properties measured by reference techniques.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully