Using parametric measurement units as a source of power for a device under test
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United States of America Patent
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Jul 22, 2008
Grant Date -
Jun 22, 2006
app pub date -
Dec 17, 2004
filing date -
Dec 17, 2004
priority date (Note) -
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Abstract
An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit configured to provide current to the device. The current from the second parametric measurement unit augments the current from the first parametric measurement unit at the device.
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