Systems and methods for minimizing scattered light in multi-SLM maskless lithography

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United States of America Patent

PATENT NO 7567368
APP PUB NO 20060146308A1
SERIAL NO

11029724

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Abstract

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The present invention is directed to a lithography system in which scattered light from a pattern generator, having one or more pattern generating devices, is blocked from an object, such as a wafer or display. The system includes a pattern generator with multiple pattern generating devices, a projection system for directing light from the pattern generating device, and an aperture located at or near an object window. The aperture has a profile that matches the configuration of the pattern generating devices. A method for blocking scattered light in a lithography system using multiple pattern generating devices is also provided.

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Patent Owner(s)

  • ASML HOLDING N.V.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cebuhar, Wenceslao A Norwalk, US 21 164
Hintersteiner, Jason D Bethel, US 15 119
Janik, Stan Naugatuck, US 2 6
Vladimirsky, Yuli Weston, US 36 463

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