Method to measure a t cell response and its uses to qualify antigen-presenting cells

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United States of America Patent

APP PUB NO 20060160153A1
SERIAL NO

10537500

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Abstract

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A method to characterize a T-cell response of a final population of T-lymphocytes resulting from the co-incubation of an initial population of T lymphocytes with a composition of antigen-presenting cells (APCs), said method comprising the steps of a) simultaneous measuring on a single cell basis at least two parameters: (i) proliferation of T lymphocytes and (ii) presence of a T cell antigen receptor on the surface of T lymphocytes and/or presence of at least one biological molecule produced by T lymphocytes, and the attribution of a positive or a negative value to each of these parameters, and b) classification of the final T-lymphocytes population into 2.sup.n different subsets of T lymphocytes, n being the number of parameters, each subset being characterized by a positive or a negative value respectively to each parameter and the determination of the proportion of T lymphocytes present in each subset with respect to the number of T lymphocytes in the final population, with said proportion being characteristic of the T-cell response. Use of the method for batch release assay and potency assay.

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Patent Owner(s)

Patent OwnerAddress
DARTMOUTH COLLEGE11 ROPE FERRY ROAD HB 6210 HANOVER NH 03755
I D M IMMUNO-DESIGNED MOLECULES172 RUE DE CHARONNE PARIS F-75011 FRANCE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abastado, Jean-Pierre Paris, FR 11 244
Bercovici, Nadege Paris, FR 1 0
Ernstoff, Marc S Us-Hanover, NH 1 0
Givan, Alice L Us-Durham, NH 1 0
Magguilli, born Salcedo Margarita Chatillon, FR 1 0
Nardin, Alessandra Paris, FR 9 138
Wallace, Paul K Orchard Park, NY 1 0

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