Arrangement and method for compensation of the temperature dependency of detectors in spectrometers
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United States of America Patent
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Aug 11, 2009
Grant Date -
Jul 27, 2006
app pub date -
Jan 20, 2006
filing date -
Jan 21, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant. With the arrangement according to the invention, the cross-influence of the environment on the detector can be compensated so that the stabilization of the detector temperature is improved. Improved stabilization of the detector temperature is ensured by the additional component of ambient temperature.
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